Wan-chun FEI(费万春)1,2
1. College of Textile and Clothing Engineering, Soochow University, Suzhou 215021, China;2. National Engineering Laboratory for Modern Silk, Suzhou 215123, China
Abstract-In order to precisely measure the diameters for obtai ning the fineness of rolling raw silk, the physical features of raw silk are ana lyzed. By means of Fresnel principle, diffractions caused by different transpare nt raw silk filaments are analyzed and simulated. Image data of raw silk filamen t measured by digital CMOS camera are analyzed and processed for obtaining the p recise diameters of the filament with the relative error of less than 1%. On the assumption of appropriate elliptic cross-section of the filament, the cross-s ection area is calculated as the fineness of the filament. Measurement experimen ts are carried out. Finally, some suggestions are proposed for photoelectric mea suring the fineness of raw silk.
Key words-fineness of raw silk; photoelectric measurement; simulation; image processing
Manuscript Number: 1674-8042(2010)03-0205-03
dio: 10.3969/j.issn.1674-8042.2010.03.01
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