Yan LI, Chun-Lei XIA, Yun-Ki KIM, Jang-myung LEE
(School of Electrical Engineering, Pusan National University, Pusan 609-735, Korea)
Abstract-A novel method for pest detection is proposed based on the theory of multi-fractal spectrum to extract pests on plant leaves. Both local and global information of the image regularity were obtained by multi-fractal analysis. By applying fractal dimension, the spots on leaf images can be extracted without loosing or introducing any information. The different parts of images are re-analysis by morphology operations to determine the candidate regions of pests. The performance of multi-fractal analysis of whitefly detection is investigated through greenhouse experiments. The experimental results show that the proposed method is robust to noise from light and is not sensitive to the complex environment.
Key words-multi-fractal analysis; image segmentation; pest detection
Manuscript Number: 1674-8042(2011)03-0240-04
doi: 10.3969/j.issn.1674-8042.2011.03.009
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