Jing-de HUANG（黄景德）， Yu-rong LU（逯玉荣）
（Dalian Naval Academy, Dalian 116018，China）
Abstract-Potential failures of electronic instrument are very common in the engineering practice. In this paper,potential failure state model is analyzed based on dynamic characteristics of electronic instrument at work and a comprehensive method of judging multi-state reliability is put forward. Then, a multi-state electronic instrument reliability analysis model is built based on Bayesian Networks(BN). Considering the failure-potential failure-normal work states，the model is built to estimate reliability of the system and the conditional probability of the elements. Finally，the model is proved corrective and effective by examples.
Key words-electronic instrument; Bayesian networks; multi-states; reliability judging
Manuscript Number: 1674-8042(2011)04-0327-03
doi: 10.3969/j.issn.1674-8042.2011.04.005
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