XUE Bing1, CAO Jian2
(1. Shijiazhuang Commanding School of the Armed Police Force, Shijiazhuang 050061, China;2. Army 61773, Urumchi 830000, China)
Abstract： This paper presents an analog circuit built-in-test (BIT) structure based on boundary scan and realizes the BIT. It predigests the test process and improves the test precision by taking the rectangular pulse as stimulator and analog switch as auxiliary bridge. The experiment of uA741 shows that the design is feasible. Compared with the traditional test method, it is better regarding reliability and measurability of the analog circuit system.
Key words： rectangular pulse; analog circuit; built-in-test (BIT); boundary scan
CLD number： TN401 Document code： A
Article ID： 1674-8042(2014)03-0012-04 doi： 10.3969/j.issn.1674-8042.2014.03.003
References
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模拟集成电路频率特性测试
薛冰1, 曹健2
(1. 武警石家庄士官学校, 河北 石家庄 050061; 2. 中国人民解放军61773部队, 新疆 乌鲁木齐 830000)
摘要:本文提出了一种基于边界扫描测试技术的模拟电路频率特性测试方法。 测试选用矩形脉冲作为激励， 通过加入模拟开关， 简化了模拟电路的测试过程。 以模拟集成芯片uA741为被测核心电路进行实验， 结果证明该设计是可行性的， 而且与传统测试方法相比，该方法具有更高的可靠性和可测性。
关键词:矩形脉冲； 模拟电路； 内建测试(BIT)； 边界扫描
引用格式：XUE Bing, CAO Jian. Characteristic test of analog integrated circuit frequency. Journal of Measurement Science and Instrumentation, 2014, 5(3): 12-15. [doi: 10.3969/j.issn.1674-8042.2014.03.003]
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