WANG Huan1, TANG Bo2, LI Zu-bo1
(1. Science and Technology on Electronic Test & Measurement Laboratory,North University of China,Taiyuan 030051, China;2. Beijing Aerospace Automatic Control Institute, Beijing 100854, China）
Abstract： For electronic piezo gauge used for testing gun chamber pressure, its internal miniature pulse-powered photoelectric invert switch cannot often be powered up normally. To solve this problem, a test system for invert switch is presented to verify the reliability of the invert switch. The test system uses complex programmable logic device (CPLD) to control data acquisition of A/D converter and data storage of external flash memory, and then transmits the acquired data to a computer for data analysis and processing. The test system can provide the required sampling frequency of the signal in high temperature, normal temperature and low temperature environments, and the reliability of the invert switch can be verified according to the signal parameters. The results show that the test system has high precision and the tested invert switch has low power consumption and high reliability.
Key words： invert switch; storage measurement technology; complex programmable logic device (CPLD); test system
CLD number： TP274Document code： A
Article ID： 1674-8042（2015）01-0036-05 doi： 10.3969/j.issn.1674-8042.2015.01.007
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194-199.基于CPLD的微型脉冲供电式光电倒置开关测试系统
王欢1 ， 唐波2， 李祖博1
（1. 中北大学 电子测试技术国家重点实验室， 山西 太原 030051；2. 北京航天自动控制研究所， 北京 100854）
摘要:针对放入式电子测压器在测试火炮膛压时， 内部的微型脉冲供电式光电倒置开关无法正常上电的问题， 设计了倒置开关的检测系统。 该系统由CPLD控制A/D转换器的数据采集和外部闪存的存储， 将采集的数据传输到计算机中进行分析处理。 系统能满足高温、 常温和低温环境下信号的采样频率， 并可根据信号参数验证倒置开关的可靠性。 试验结果表明， 该检测系统精确度高， 且被测倒置开关功耗低、 可靠性高。
关键词:倒置开关； 存储测试； CPLD； 测试系统
引用格式：WANG Huan, TANG Bo, LI Zu-bo. Test system for miniature pulse-powered photoelectric invert switch based on CPLD. Journal of Measurement Science and Instrumentation, 2015, 6(1)： 36-40. ［doi： 10.3969／j.issn.1674-8042.2015.01.007］
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