Jian-jun LIU(刘建军)1, Xue-wen PAN(潘学文)2
1. School of Information Engineering, Jimei University, Xiamen 361021, China;2. School of Computer Communication Engineering, Hunan University of Science and Engineering, Yongzhou 425100, China
Abstract-In this paper, by using the folding counter and linea r feedback shift register, a new vector generator is proposed. The decisive test ing patterns are generated by using the selected fold distance. Then the folding counter seeds are encoded by the specialized seed encoder and clock gating, the ineffective patterns do not act upon the circuit under test, these testing patt erns are designed to form a pseudo single input change set, so as to lead to pro minent decreases in power consumption and redundant testing patterns generated b y different seeds, without losing stuck-at fault coverage. Experimental results based on ISCAS’85 benchmark circuits demonstrate the efficiency of the approac h.
Key words-Folding counter; pseudo single; power consump tion
Manuscript Number: 1674-8042(2010)03-0276-05
dio: 10.3969/j.issn.1674-8042.2010.03.16
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