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Mutual coupling suppression of aperture coupled microstrip antenna array


CHENG Xiu-yang, TENG Fei

 

(College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao 266590, China)

 

Abstract: A mutual coupling suppression method is proposed for microstrip antenna array by cutting four small semi-circle annular apertures on the metal plate. The structure of antenna array is composed of 2×2 four elements. The antenna consists of double layer dielectric, and it realizes circular polarization characteristics by cutting rectangular slot on circular patch in the direction of 45°, by using aperture coupling feeding and reverse feeding principle. There is 90° phase difference between adjacent antenna elements. Thus, it cuts off the coupling current field between the elements, suppresses the surface wave and reduces the mutual coupling by cutting four semi-circle annular apertures symmetrically on the metal plate. The simulation results show that after cutting four semi-circle annular apertures, the antenna array coupling coefficients decrease significantly, and the side and back lobe levels are suppressed effectively with the gain of antenna improved. So the proposed method is effective to suppress microstrip antenna array mutual coupling.

 

Key words: mutual coupling;microstrip antenna array; aperture coupling; semi-circle annular aperture

 

CLD number: TN811+.3 Document code: A

 

Article ID: 1674-8042(2014)02-0044-04 doi: 10.3969/j.issn.1674-8042.2014.02.008

 

References

 

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孔径耦合微带天线阵互耦的抑制

 

程秀洋, 滕飞

 

(山东科技大学 电气与自动化工程学院, 山东 青岛 266590 )

 

摘要:本文提出了一种在金属板开4个半圆缝隙来抑制微带天线阵阵元之间耦合的方法. 微带天线阵为4单元结构, 天线为双层介质层. 通过在圆形贴片45°方向开矩形缝隙来实现圆极化特性, 利用孔径耦合馈电及反向馈电原理, 保证相邻的2个单元均有90°相位差. 在金属板上对称地开4个半圆形缝隙切断了单元间的耦合电流场, 抑制了表面波, 降低了单元间的耦合效应. 仿真结果显示, 当在接地板上对称地开4个半圆形缝隙后, 微带天线阵的耦合系数明显降低, 旁瓣与后瓣电平被有效地抑制, 天线的增益增加. 因此, 这是一个十分有效的抑制微带天线阵阵元间耦合的方法.

 

关键词:互耦; 微带天线阵列; 孔径耦合; 半圆环形孔径

 

引用格式:CHENG Xiu-yang, TENG Fei. Mutual coupling suppression of aperture coupled microstrip antenna array.

 

Journal of Measurement Science and Instrumentation, 2014, 5(2): 44-47. [doi: 10.3969/j.issn.1674-8042.2014.02.008]

 


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